40 CFR Part 63, Table 10
Verified against eCFR.gov as of June 20, 2026View official text on eCFR.gov ↗
As required in § 63.5865(a), in order to comply with a percent reduction limit for continuous lamination lines and continuous casting lines you must determine the data in the following table:
| For each line where the wet-out area . . . | And the oven . . . | You must determine . . . |
|---|---|---|
| 1. Has an enclosure that is not a permanent total enclosure (PTE) and the captured organic HAP emissions are controlled by an add-on control device | a. Is uncontrolled | i. Annual uncontrolled wet-out area organic HAP emissions,ii. Annual controlled wet-out area organic HAP emissions,iii. Annual uncontrolled oven organic HAP emissions,iv. The capture efficiency of the wet-out area enclosure, |
| v. The destruction efficiency of the add-on control device, andvi. The amount of neat resin plus and neat gel coat plus applied. | ||
| 2. Has an enclosure that is a PTE and the captured organic HAP emissions are controlled by an add-on control device | a. Is uncontrolled | i. Annual uncontrolled wet-out area organic HAP emissions,ii. Annual controlled wet-out area organic HAP emissions,iii. Annual uncontrolled oven organic HAP emissions,iv. That the wet-out area enclosure meets the requirements of EPA Method 204 of appendix M to 40 CFR part 51 for a PTE,v. The destruction efficiency of the add-on control device, andvi. The amount of neat resin plus and neat gel coat plus applied. |
| 3. Is uncontrolled | a. Is controlled by an add-on control device | i. Annual uncontrolled wet-out area organic HAP emissions,ii. Annual uncontrolled oven organic HAP emissions,iii. Annual controlled oven organic HAP emissions,iv. The capture efficiency of the oven,v. the destruction efficiency of the add-on control device, andvi. the amount of neat resin plus and neat gel coat plus applied. |
| 4. Has an enclosure that is not a PTE and the captured organic HAP emissions are controlled by an add-on control device | a. Is controlled by an add-on control device | i. Annual uncontrolled wet-out area organic HAP emissions,ii. Annual controlled wet-out area organic HAP emissions,iii. Annual uncontrolled oven organic HAP emissions,iv. Annual controlled oven organic HAP emissions;v. The capture efficiency of the wet-out area enclosure,vi. Inlet organic HAP emissions to the add-on control device,vii. Outlet organic HAP emissions from the add-on control device, andviii. The amount of neat resin plus and neat gel coat plus applied. |
| 5. Has an enclosure that is a PTE and the captured organic HAP emissions are controlled by an add-on control device | a. Is controlled by an add-on control device | i. That the wet-out area enclosure meets the requirements of EPA Method 204 of appendix M to 40 CFR part 51 for a PTE,ii. The capture efficiency of the oven, and |
| iii. The destruction efficiency of the add-on control device. |